TTTC's Electronic Broadcasting Service

CALL FOR PAPERS

Scope -- Submissions -- Key Dates -- Additional Information -- Committee

Scope

The IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems provides a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems. The DDECS Symposium series has been organized by these European countries: Czech Republic (1997, 2002, 2006, 2009, 2013), Poland (1998, 2003, 2007, 2014), Slovakia (2000, 2004, 2008), Hungary (2001, 2005), Austria (2010), Germany (2011) and Estonia (2012).

DDECS 2015 will take place in Belgrade, the Serbia's capital. Belgrade sits at the confluence of the two rivers (Danube and Sava), both of which draw you like a magnet when the sun is out and the temperatures rise. Belgrade is the home town of the astrophysicist Milutin Milanković, mathematician Mihailo Petrović, and winner of the Nobel Prize in literature Ivo Andrić. It hosts around hundred thousand students at more than 10 universities. Over eight hundred thousand tourists are attracted every year by the Belgrade's cultural events (International Film Festival, Belgrade International Theatre Festival, and Belgrade Jazz Festival), museums (National Museum and Nikola Tesla Museum), exhibitions and nightlife.

The areas of interest include (but are not limited to) the following topics:

SoC and NoC Design and Test
Design and Test in Nano-Technologies
ASIC/FPGA Design
Analog, Mixed-Signal, RF Design and Test
Built-in Self-Test and Self-Repair
ATE Hardware and Software
Bio-Inspired Hardware
Design for Testability and Diagnosis
Design Verification/Validation
On-line Testing
Formal Methods in System Design
Embedded Systems Testing
Hardware/Software Co-Design
Memory, Processor Testing
IP-based Design
MEMS Testing
Logic Synthesis
Physical Design
Defect/Fault Tolerance and Reliability
Dependable HW/SW Systems

Submissions

top

Authors are invited to submit original and previously unpublished papers using the electronic submission system at the Symposium web page. Papers can be submitted in the following categories:

Regular Paper: A paper presenting an original and novel scientific content (maximum 6 pages in the IEEE two-column format).
Industrial Paper: The paper is submitted from an industrial sector, possibly as a joint work with research institutes and it has the character of industrial results, e.g. a real chip design, fabrication defects analysis, a new design and/or test technique used in company, design and/or test problems that need to be solved, etc. The paper should have at most 6 pages in the IEEE two-column format.
Student Paper: A paper presenting results of a student's PhD or master work. In order to be eligible as a student paper, the first author has to be the student (or more than one student in case of joint work), and the second author the advisor. The accepted paper has to be presented by the student. The paper should have at most 4 pages in the IEEE two-column format.
Embedded Tutorial: One hour tutorials will be embedded into the program. Authors should submit their proposal in the form of an extended abstract (2-4 pages) along with a short CV.

Accepted papers will be included in the Symposium Proceedings and submitted for inclusion into IEEEXplore as well as other Abstracting and Indexing (A&I) databases.

Key Dates

top

Paper submission deadline: ~~January 18, 2015~~ January 25, 2015

Notification of acceptance: March 13, 2015

Camera ready: March 20, 2015

Symposium: April 22-24, 2015

Additional Information

top

Zoran Stamenkovic - General Chair

IHP GmbH

Im Technologiepark 25

15236 Frankfurt (Oder), Germany

Tel: +49 335 5625 726

E-mail: stamenko@ihp-microelectronics.com

Jaan Raik - Program Chair

TTÜ Arvutitehnika instituut

Akadeemia tee 15a

Tallinn 12618, Estonia

Tel: +372 620 2257

E-mail: jaan.raik@ati.ttu.ee

Committee

top

General Chair
Zoran Stamenković, IHP (DE)

General Vice-Chair
Witold Pleskacz, WUT (PL)

Program Chair
Jaan Raik, TTU (EE)

Program Vice-Chair
Heinrich Theodor Vierhaus, BTU (DE)

Topic Chairs
Görschwin Fey (DE)
Igor Filanovsky (CA)
Matteo Sonza Reorda (IT)
Mile Stojčev (RS)

Organizing Chair
Božidar Radenković, UB (RS)

Steering Committee
V. Stopjaková, (SK)
M. Baláž (SK)
T. Garbolino (PL)
E. Hrynkiewicz (PL)
A. Kraśniewski (PL)
H. Manhaeve (BE)
O. Novák (CZ)
A. Pataricza (HU)
A. Pawlak (PL)
W. Pleskacz (PL)
J. Raik (EE)
M. Renovell (FR)

For more information, visit us on the web at: http://www.ddecs2015.org/

The 18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).